Theoretical and Experimental Analysis of Terahertz Scattering from Rough Surfaces
S Wang, T Yamada, KS Chen, Y Kasai - IEICE Technical Report; IEICE …, 2021 - ken.ieice.org
S Wang, T Yamada, KS Chen, Y Kasai
IEICE Technical Report; IEICE Tech. Rep., 2021•ken.ieice.org(in English) In this paper, we explore the terahertz scattering from statistically-specified
randomly rough surfaces at 480 GHz. These contain eight reference surfaces made from
Durable Resin V2 by 3D printing with the prescribed power spectral density and height
probability density function, along with the RMS heights and correlation lengths. The
dielectric constant of the material was measured by terahertz time-domain spectroscopy
(THz-TDS). To better understand the physical mechanism of the terahertz scattering from …
randomly rough surfaces at 480 GHz. These contain eight reference surfaces made from
Durable Resin V2 by 3D printing with the prescribed power spectral density and height
probability density function, along with the RMS heights and correlation lengths. The
dielectric constant of the material was measured by terahertz time-domain spectroscopy
(THz-TDS). To better understand the physical mechanism of the terahertz scattering from …
(in English) In this paper, we explore the terahertz scattering from statistically-specified randomly rough surfaces at 480 GHz. These contain eight reference surfaces made from Durable Resin V2 by 3D printing with the prescribed power spectral density and height probability density function, along with the RMS heights and correlation lengths. The dielectric constant of the material was measured by terahertz time-domain spectroscopy (THz-TDS). To better understand the physical mechanism of the terahertz scattering from random rough surfaces, the effects of root-mean-square (RMS) height, correlation length, dielectric constant, and probing frequency, polarization, and incidence angle were investigated. We applied the well-known advanced integral equation model (AIEM) to calculate HH-and VV-polarized scattering coefficients, both coherent and incoherent. Numerical results indicate that the diffuse scattering is enhanced when the RMS height increases, particularly in backscattering. As the correlation length varies, the scattering patterns illustrate a strong azimuthal dependence. We conducted measurements to measure the given rough surfaces by Picometrix T-Ray 4000. The measured results show that, at terahertz region, the reflectivity decreases as the surface roughness increases. Hence it is practically feasible to remote sensing of the rough surface by terahertz scattering.
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