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Surface-Plasmon-Resonance Spectroscopy Minniu Zhou, Akira Otomo, Shiyoshi Yokoyama, and Shinro Mashiko Near-infrared surface-plasmon-resonance (SPR) spectroscopy can be used to determine the thickness of single-organic-molecular films and the permittivities of organic materials, with a high degree of sensitivity. The two-wavelength SPR method with one NIR and one visible-light probes was used to improve the accuracy of our experiment. Structures of organic-molecules on different substrates were investigated. We particularly focused on the error in the measurement of thickness caused by the surface roughness of the substrate. The effect of this substrate roughness was determined with the aid of AFM observations. The error in measurement caused by a rough substrate was thus estimated. Keywords surface plasmons; infrared spectroscopy; organic substances; Langmuir-Blodgett films |