The023th KARC Colloquium
The023th KARC Colloquium was ended. Thank you for the participation.
| Date&Time | March 18th, 2003 Tuesday 14:00 - 15:30 |
| Place | The Middle-sized Conference Room, 2ndResearch Building, 3 Fl, KARC |
| Lecturer | "Atomic Force Microscopy Investigation of Nanoelectronics" |
| Speaker | Prof.Peter. H. Grutter Physics Department, McGill University (Montreal, Canada) |
| Abstract | In this talk I will present three different areas of research pursued in my group. The common link is that we are investigating various systems with potential in nanoelectronics by the technique of atomic force microscopy. Atomically defined contacts to molecules are crucial if the electrical transport properties of molecules are to be understood. By comparing such atomically defined experiments to ab-initio modeling, a better understanding of the structure-property relationship is expected. Experimentally, we use a combined UHV AFM/STM/FIM (field ion microscope) that allows us to investigate the electromechanical properties of two terminal devices with atomically defined junctions. The properties of self-assembled quantum dots can be measured by cryogenic electrostatic force microscopy. The addition of an extra electron manifests itself as a readily measurable increase of the electrostatic interaction between tip and sample. We will present initial results of InP quantum dots measured at 4.5 K. Finally, we are using Magnetic Force Microscopy to investigate the potential of small magnetostatically coupled ferromagnetic particles as cellular automata. The major issue is the switching field distribution of these micro fabricated particles as a function of size, shape and processing conditions. This is investigated by MFM in the presence of external fields. |
| Language | English |
| Admission | Free |
| Organizer | Dr. Shinro Mashiko, Group leader Dr. Shukichi Tanaka, Senior research member Nanotechnology Group, Kansai AdvancedResearch Center Communications Research Laboratory |