The062th KARC Colloquium

The062th KARC Colloquium was ended. Thank you for the participation.


Date&Time Friday July 8, 2005 14:30-15:30
Place Conference Room, 3F, Research Building 2, KARC
Lecturer "CONAN - A Design Exploration Framework for Reliable Nano-Electronics Architectures -"
Speaker Prof.Sorin Cotofana
(Delft University of Technotogy,The Netherlands)
Abstract n this talk we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. Our approach is based on a generic (parametrical) architectural template, called COnfigurable Nanostructures for reliAble Nano electronics (CONAN), which embeds support for reliability at various levels of abstractions. Some of the main reliability sources are: 1. regular and decentralized structures based on simple basic computation cells designed to be robust against disturbances and noise, 2. fault tolerance based on hardware, 3. time and information redundancy applied at the basic cell level as well as at higher levels, 4. self diagnosis assisted by the dynamic reconfiguration of basic computation cells, and 5. interconnect rerouting. Within the CONAN template both technology dependent and independent models co-exists such that the more abstract layers are technology independent while the lower levels can be retargeted to various fabrication technologies. The CONAN design methodology allows designers to deal with unpredictability and low reliability, which are unavoidable characteristics of future emerging nano-devices. It also provides means to trade area,delay, and power consumption for reliability. As such, CONAN is a systematic design methodology for reliable systems.
Language English
Admission Free
Organizer Fardinand Peper
Nanotechnology Group,Kansai Advanced Research Center,National Institute of Information and Communications Technology